复合材料英文文献论文及翻译

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Fig. 1 shows that diamond particles are dispersed in thecopper matrix. 图形一展示了 钻石颗粒可以分散在铜质型片里Since the diamond particles are easy to bestripped off during mechanical polishing, small pits are lefton the surface of samples. 由于这些钻石颗粒在化学抛光的过程中很容易分离出来，所以样品的表面会留下小凹痕When the samples were analyzedby electron probe for carbon, the particles displayed highcarbon peaks, as shown in Fig. 2.当这些样品电子探针被分解时，这些微粒表现出高的碳值（carbon peak是某化学术语吧，不了解）就如2图所示Fig. 3 exhibits the analyzed result for extractedproduct of the copper–diamond composite by X-raydiffraction (XRD) analysis.(图三展示了对铜钻石的提取物质用X-ray(XRD分析方法）分析的分析结果)。。 It is shown that three diffraction peaks exist, shown as A, B and C, respectively.（他说明如果衍射峰存在的话，就分别像A，B，C）The interplanar distances corresponding to the threepeaks and standard ones for diamond are compared inTable 1. （这些对应三个峰的晶面间的距离，和标准值在图一中作了对比）The measured values of the interplanar distancesare in good agreement with the standard ones, demon-strating that the extracted product should be the carbonin diamond state.(经过测试的晶面间的距离和标准值一致，说明这些提取物质应该是钻石形态时的碳 ）（神马竟然还有钻石形态，总不能是钻石州吧） Fig. 4(a) gives a TEM micrograph showing distributionand morphology of diamond particles (indicated as A, B,and C) in the copper–diamond composite. 图四A是一个TEM显微照片展示了铜钻石合成体的的分布及形态，就如ABC图所展示的The calibration of interplanar distance for diffraction rings in Fig. 4(b) wasgiven in Table 2. 图四晶面间的距离衍射环的校准在图表2中Compared to Table 1, it is also demonstrated that the calibrated interplanar distances for thediffraction rings conform to the standard ones of diamond.与一相比，他也说明了图四晶面间的距离衍射环的校准与标准样本相符Therefore, it is believed that the graphitization of diamondparticles hardly occurs after sintering at 1150–1220 K in the copper–diamond composite.所以说，钻石颗粒的石墨化几乎不会发生在尽力了1150-1220k在铜钻化合物烧结过后Although diamond is a metastable allotropic modification of carbon, the graphitization of diamond particles in the copper–diamond composite did not occur, or the degree ofgraphitization was too small to be found.（尽管钻石是碳的同素异形体，钻石的石墨化在铜钻化合物中不会发生，或者就是石墨化程度很小，没有发现）It is believed that the beginning temperature of graphi-tization would be associated with the purity of diamond powders. 我们相信石墨化的温度和钻石的纯度有关The impurities such as some metallic elements reduce the beginning temperature of diamond graphitization.像金属元素这些杂志，减低了需要石墨化的温度 When diamond is fabricated by the static synthesis method, Fe and Ni are often used as catalysts and are present in diamond as impurities to decrease the beginningtemperature of graphitization（在用静电合成方法构造钻石时，Fe和镍是作为催化剂的，他们也作为杂质减低了钻石石墨化的温度） [6]. It is understandable that both for the graphitization and its reverse reactions, theiractivation energies can be decreased by catalytic agents.（这很容易理解，石墨化合它的逆向反应，他们的发生能力都会因为催化剂而降低）Compared with the diamond fabricated by static synthesis,the diamond powders prepared by explosion method do not contain metallic impurities, thus leading to an obviousincrease in the beginning temperature of graphitization.（与用静电合成方法构造的钻相比石，用爆炸方法取得的钻石不包含金属杂志，提高了石墨化的起始的温度）Hence, the detonation synthetic diamond might be moreresistant to graphitization and probably suitable for theelectric contact materials. （因此，爆炸合成的钻石更加能抵制石墨化，同时也更合适和电接触的物质，就是带电体）

希望采纳！本人能力有限！只能帮到这图1显示金刚石粒子分散的铜基体。自从金刚石粒子比较容易在机械抛光脱下衣服,小坑里留下了。表面上的样品。当样品进行了分析通过电子探针对碳、粒子显示高碳的山峰,如图2号。图3的展品分析结果为提取出来copper-diamond产品的复合利用x射线衍射(XRD)分析。结果表明,三见dis -分数峰存在,表现为一,B和C,分别。距离的interplanar相应于这三套对钻石峰标准的比较表1。interplanar测量值的距离在标准的吻合很好,恶魔-起动,提取的产品应该是碳在钻石的状态。图4(a)给出了透射电镜显微图显示分布金刚石粒子形貌和(显示为A,B,copper-diamond和C)复合材料。 校准interplanar衍射环的距离图4中了(b)所给的表2。相比,表1,它也是恶魔-strated interplanar距离的校准的衍射环的符合标准的钻石。因此,人们相信石墨化的钻石在粒子1150-1220几乎不发生后的烧结Kcopper-diamond复合材料。尽管钻石是亚稳态allotropic modifica -实践,石墨化碳的金刚石粒子在copper-diamond复合,没有发生,或者程度石墨化太小,被发现。据说起始温度的graphi -tization会伴随着纯度的钻石粉末等。某些金属等杂质元素减少金刚石graphitiza起始温度-信息。金刚石是静态合成捏造出来的方法、铁、镍催化剂和经常被用于目前在钻饰作为杂质,降低开始蛋彩画颜料